Scanning Probe Microscopy |
Atomic Force Microscope |
NST 3.122 |
Molecular Force Probe Microscope |
NST 3.122 |
Nano Device Fabrication and Testing Facility |
Dual Beam FIB |
NST 3.110 |
Zyvex Nano Manipulator |
NST 3.110 |
Denton Thermal Evaporator |
NST 3.132 |
MBraun Glovebox |
NST 3.132 |
Probe Station-I (Kari Suss) |
NST 3.110 |
Optical Inspection Microscope |
NST 3.122 |
Keithley 4200 DC Characterization System |
NST 3.110 |
Agilent Parametric Analyzer-I (4155C) |
NST 3.110 |
Electronic and Vibrational Spectroscopy Facility |
Fluorescence Lifetime Apparatus |
NST 2.124 |
Fluorimeter (UV-VIS and IR detectors) |
NST 3.104 |
UV-VIS-NIR Spectrometer |
NST 3.110 |
Fourier Transform Infrared Spectrometer (FTIR) |
NST 3.110 |
Wide-Field Microscope |
NST 2.116 |
|
Facility Name |
Location |
Suss MA-6 Mask Aligner |
NST 4.106 |
Veeco Dektak 6M Stylus Profilometer |
NST 4.106 |
Hirox 3d Video Microscope |
NST 4.106 |
Spincoater |
NST 4.106 |
Critical Point Drier |
NST 4.106 |
March Plasma CS1791F RIE Etching System |
NST 4.106 |
Ellipsometer |
NST 4.106 |
Fume Hood |
NST 4.106 |
e-Beam Lithography |
NST 4.106 |
e-Beam Evaporator (Edwards) |
NST 4.106 |
Wire Bonder |
NST 4.106 |
Probe Station-II (Kari Suss) |
NST 4.106 |
Agilent Parametric Analyzer-II (4155C) |
NST 4.106 |
Rapid Thermal Annealer |
NST 4.106 |
Dicing Saw |
NST 4.106 |
