Equipment: Kratos Photoelectron Spectrometer (XPS)

Description

The x-ray photoelectron spectrometer (XPS) was purchased from the Kratos Analytical Company. The spectrometer provides elemental and chemical state information on all types of sample surfaces from solid thin films, including dried powders.

This instrument is also equipped with the following surface analysis techniques:

• Ion Scattering Spectroscopy (ISS)
• Ultraviolet Photoelectron Spectroscopy (UPS)
• A delay-line detector for two-dimensional imaging in XPS mode

Location

FNT 2.108

Fees

Trained On campus users:  $48/hour
Assisted On Campus users:  $94/hour
Non-Profit Organizations:  $107/hour
Private Sector:  $489/hour

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