Equipment: Hitachi S-5500 SEM equipped with STEM
This instrument was purchased in 2008. The S-5500 is an in-lens field-emission gun scanning electron microscope with a 0.4 nm lateral resolution at 30 keV. It is also equipped with a dark-field detector and a bright-field detector for scanning-transmission electron microscopy (STEM) imaging. The BF/DF dou-STEM detector allows simultaneous observation of BF and DF STEM images. The acceptance angle of the DF STEM signal is variable and can be selected from the menu. An energy dispersive spectroscopy detector (Bruker EDS Quantax 4010) is also installed for elemental stoichiometric ratios, multiple elemental line scanning, and 2-dimensional mapping. The topography and composition of a sample is also complimented with an automated YAG backscattered electron detector.
$45/hour for UT users
$379.00/hr for industry users (e.g., for-profit company)
Hrs available with TMI assistance: Monday-Friday from 9am to 4pm. SEM Facility is open 24 hrs. every day of the week with proximity card access.
Learning sessions: 3 sessions, each session is 2 hrs. 1st session: basic operations and functions of the SEM using TMI reference materials. 2nd session: imaging using user’s samples. 3rd session: SEM imaging combined with EDS and/or backscattered electron detector.
Shouliang Zhang, Ph.D.
Electron Microscopy Facility Manager
Texas Materials Institute, UT-Austin
Cell Ph: 512-656-9624
Office Ph: 512-232-7002